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Performance limits for the scanning tunneling microscope

 

作者: T. Tiedje,   A. Brown,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 68, issue 2  

页码: 649-654

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.346794

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The electromechanical performance limits of a tube scanner type, scanning tunneling microscope are analyzed with respect to the three figures of merit: noise level, scan speed, and scan range. A simple tradeoff between the tube resonant frequency and scan range is defined. For a critically damped scanner tube, a good balance between scan speed and scan range is achieved with a preamplifier bandwidth equal to the resonant frequency of the scanner tube, in which case the closed loop control system bandwidth (90° phase margin) is 2/&pgr; times the resonant frequency of the tube, for a proportional‐integral controller. This control loop bandwidth is shown to be compatible with a noise performance that is limited by shot noise in the tunnel junction.

 

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