Secondary Electron Yield from Fission Fragments
作者:
F. E. Jamerson,
C. B. Leffert,
D. B. Rees,
期刊:
Journal of Applied Physics
(AIP Available online 1965)
卷期:
Volume 36,
issue 2
页码: 355-356
ISSN:0021-8979
年代: 1965
DOI:10.1063/1.1713994
出版商: AIP
数据来源: AIP
摘要:
The secondary electron yield from fission fragments has been measured directly using an ultrahigh‐vacuum diode containing uranium which was operated in a nuclear reactor. The current measured in this diode consisted of contributions from the positively charged fission fragments, secondary electron emission induced by fission fragments, and photoelectrons generated by gamma radiation. The secondary electron yield &Dgr; was determined from the secondary electron current and the computed fission fragment emission rate. For a thick (>one range) uranium‐nickel (5.7 wt. % nickel) alloy the value of &Dgr; is 207±10.
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