DESIGN AND DEVELOPMENT OF A PHASE SENSITIVEV(z) RESPONSE MEASUREMENT SYSTEM IN THE 20–150MHz FREQUENCY RANGE
作者:
S. PARTHASARATHI,
B.R. TITTMANN,
期刊:
Nondestructive Testing and Evaluation
(Taylor Available online 1997)
卷期:
Volume 13,
issue 3
页码: 127-138
ISSN:1058-9759
年代: 1997
DOI:10.1080/10589759708953024
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
Quantitative acoustic microscopy involves the measurement of the Voltage-Defocus response or theV(z) response followed by subsequent analysis to extract material characteristics such as surface wave velocity and attenuation. An amplitude and phase measuring acoustic microscopy system has been developed with commercially available tone-burst equipment for accurate mono-frequency measurements in the 20–150MHz regime. The Rayleigh wave velocities of various materials were extracted using the new system and these were in good agreement with the published values.
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