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Digital chemical vapor deposition of SiO2

 

作者: M. Nakano,   H. Sakaue,   H. Kawamoto,   A. Nagata,   M. Hirose,   Y. Horiike,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 57, issue 11  

页码: 1096-1098

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.104284

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The repetitive cycles of a few monolayers hydrogenated silicon deposition and its oxidation has been employed for the growth of SiO2. The surface reaction is promoted by an alternate irradiation of silicon hydride radical beam produced by the upstream pulsed microwave discharge of SiH4and discharged oxygen beam. The deposition rate is controlled by the flow velocity of silane gas jet and substrate temperature. It is shown that the deposition species ejected with supersonic velocity into a high vacuum reactor conformably fills the SiO2film into a deep Si trench.

 

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