Determination of Object Thickness in Electron Microscopy
作者:
L. Marton,
L. I. Schiff,
期刊:
Journal of Applied Physics
(AIP Available online 1941)
卷期:
Volume 12,
issue 10
页码: 759-765
ISSN:0021-8979
年代: 1941
DOI:10.1063/1.1712863
出版商: AIP
数据来源: AIP
摘要:
It is proposed that the thicknesses of electron microscope objects be determined by measuring the diminution in intensity of the electron beam caused by the object. Since this method would only be applied to specimens so thin that multiple scattering can be neglected, one need know only the total cross section for single scattering of electrons outside the aperture angle of the electron microscope objective. These cross sections are calculated for fast electrons (energies greater than 10,000 ev) by means of the Born approximation for several cases of practical interest, and the results are applied to some experimental observations.
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