Experimental verification of a form‐birefringent polarization splitter
作者:
K. Shiraishi,
T. Sato,
S. Kawakami,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 58,
issue 3
页码: 211-212
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.104691
出版商: AIP
数据来源: AIP
摘要:
Experimental verification is made of a new polarization splitter which utilizes artificial anisotropic dielectrics. The splitter is composed of layers of periodically laminated SiO2/TiO2thin films. The SiO2and TiO2films are alternately deposited by rf sputtering and reactive dc sputtering, respectively. The thickness of each layer is 50 nm, while the total number of the layers amounts to 2000. The measured polarization split angles are 5.7° (&lgr;=0.63 &mgr;m) and 5.1° (&lgr;=1.3 &mgr;m), being roughly the same as those predicted.
点击下载:
PDF
(267KB)
返 回