Dielectric Fabry–Pe´rot interferometer for temperature dependent far‐infrared reflectivity measurements of heavy‐fermion metals in high magnetic fields
作者:
T. Kohnen,
J. J. Koning,
J. Burghoorn,
P. Wyder,
P. Lejay,
期刊:
Review of Scientific Instruments
(AIP Available online 1996)
卷期:
Volume 67,
issue 12
页码: 4304-4310
ISSN:0034-6748
年代: 1996
DOI:10.1063/1.1147530
出版商: AIP
数据来源: AIP
摘要:
A far‐infrared reflectivity set up has been developed for spectroscopy on highly reflective materials in a 20 T‐class resistive Bitter magnet. As a first application, far‐infrared reflectivity measurements on the heavy‐fermion compound URu2Si2have been performed using a silicon reflection Fabry–Pe´rot interferometer as a multiple reflection device. In a resonance, this Fabry–Pe´rot technique is one order of magnitude more sensitive than a single reflection measurement. Changes in the reflectivity as a function of magnetic field are resolved with an accuracy of 0.2% and the absolute value of the reflectivity can be obtained with an accuracy of 0.5%. With this interferometer, an excitation at about 40 cm−1in the heavy‐fermion system URu2Si2is investigated at temperatures between 2 and 20 Kelvin and in magnetic fields up to 20 T. The excitation appears to extend to lower energies under influence of a large magnetic field. ©1996 American Institute of Physics.
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