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Micromachined silicon sensors for scanning force microscopy

 

作者: O. Wolter,   Th. Bayer,   J. Greschner,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1991)
卷期: Volume 9, issue 2  

页码: 1353-1357

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585195

 

出版商: American Vacuum Society

 

关键词: ATOMIC FORCE MICROSCOPY;SENSORS;SILICON;MACHINING;FABRICATION;ETCHING;THIN FILMS

 

数据来源: AIP

 

摘要:

We have developed a batch process for the microfabrication of silicon force sensors. A force sensor typically consists of a tip mounted onto a cantilever which is connected to a handling piece. The sensors are being used as microprobes and force transducers in scanning force microscopes. Our sensors are etched from single crystal silicon. The process, which mainly involves a combination of wet and dry etching techniques, results in cantilevers and tips suitable as general purpose force sensors. The newly developed batch microfabrication process is superior to the process which uses wet etching of individual metal wires and it differs substantially from the known process to produce thin film cantilevers with and without integrated tips. The sensors have been applied in various microscopes, and with different types of operation including the repulsive, attractive, and magnetic force mode.

 

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