Tip‐surface forces during imaging by scanning tunneling microscopy
作者:
M. Salmeron,
D. F. Ogletree,
C. Ocal,
H.‐C. Wang,
G. Neubauer,
W. Kolbe,
G. Meyers,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1991)
卷期:
Volume 9,
issue 2
页码: 1347-1352
ISSN:1071-1023
年代: 1991
DOI:10.1116/1.585194
出版商: American Vacuum Society
关键词: SCANNING ELECTRON MICROSCOPY;TUNNEL EFFECT;DEFORMATION;SURFACES;COMPRESSION;SHEAR;PLASTICITY;GRAPHITE;SULFUR;HIGH VACUUM;ULTRAHIGH VACUUM;FORCES;graphite;S
数据来源: AIP
摘要:
The effect of compressive and shear forces between tip and surface during the operation of the scanning tunneling microscope (STM) is illustrated with examples obtained both in air and vacuum environments. We show that at typical gap resistances used in STM (≤20 GΩ) these forces can have significant effects. Compressive or repulsive forces give rise to anomalous topographic corrugations (elastic deformations) as well as to permanent damage (inelastic or plastic deformation). These forces also cause the anomalously low values obtained in measurements of the tunneling barrier height. The effects of shear forces when imaging weakly bound material will also be demonstrated.
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