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Transmittance and reflectance of a coated substrate with application to index measurement of thin films

 

作者: J. SooHoo,   R. D. Henry,  

 

期刊: Journal of Applied Physics  (AIP Available online 1978)
卷期: Volume 49, issue 2  

页码: 801-803

 

ISSN:0021-8979

 

年代: 1978

 

DOI:10.1063/1.324661

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Equations are derived for the transmittance and reflectance of a coated substrate of finite thickness. These equations are valid for thick substrates and thin films whose surfaces are specularly reflecting. It is found that the results are in good agreement with spectrophotometer readings of corresponding laboratory samples. Based upon the present results, a simple technique for calculating the refractive index of thin films from photometer readings is given.

 

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