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Note on Positive‐Ion Effects in Pulsed Electron Beams

 

作者: Jose´ T. Senise,  

 

期刊: Journal of Applied Physics  (AIP Available online 1958)
卷期: Volume 29, issue 5  

页码: 839-841

 

ISSN:0021-8979

 

年代: 1958

 

DOI:10.1063/1.1723295

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Positive‐ion effects have been observed in pulsed electron beams of short duration (0.5 to 5 microseconds), under conditions of operation normally encountered in high‐power microwave tubes. Three different aspects of ion effects were studied; (1) beam focusing, (2) ion oscillations, and (3) ion trapping at scallop minima. Experimental results are given and correlated with previous work on ion effects by other authors.

 

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