首页   按字顺浏览 期刊浏览 卷期浏览 Contrast of a stacking fault in x‐ray section topography study of the Laue&hyphe...
Contrast of a stacking fault in x‐ray section topography study of the Laue‐Bragg case

 

作者: Y. Epelboin,  

 

期刊: Journal of Applied Physics  (AIP Available online 1979)
卷期: Volume 50, issue 3  

页码: 1312-1317

 

ISSN:0021-8979

 

年代: 1979

 

DOI:10.1063/1.326164

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have studied the contrast of a stacking fault in the Laue‐Bragg case, i.e., when the wave fields incident from the defect are reflected from its surface and never propagate into the other part of the crystal. To calculate the contrast of such a defect we have computed the images by a direct integration of Takagi’s equations. We show the influence of different parameters such as the geometry of the fault, the fault vector, and the photoelectric absorption. The results are very similar to those obtained by Authier in the Laue‐Laue case and the contrast may be explained in a similar manner.

 

点击下载:  PDF (372KB)



返 回