Microstructure of tellurium films
作者:
B. Chakrabarti,
S. Chaudhuri,
G. L. Malhotra,
A. K. Pal,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 8
页码: 4111-4114
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.328221
出版商: AIP
数据来源: AIP
摘要:
Growth and structure of tellurium films deposited by molecular beam technique onto NaCl single‐crystal and glass substrates were studied by TEM. It was observed that films deposited onto NaCl substrate have a structure similar to those obtained by other workers. The films deposited on glass at a substrate temperature of 150 °C have an altogether different structure showing a definitec‐axis orientation with needle‐shaped crystallites lying parallel to the substrate plane.
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