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Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy

 

作者: G. H. Vander Rhodes,   J. M. Pomeroy,   M. S. U¨nlu¨,   B. B. Goldberg,   K. J. Knopp,   D. H. Christensen,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 15  

页码: 1811-1813

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.121192

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have mapped the internal pump intensity distribution of an optically pumped vertical-cavity surface-emitting laser. Spontaneous emission from quantum wells placed throughout the distributed Bragg reflectors is correlated to the pump intensity. The emission is monitored along the cleaved edge using the high spatial resolution and shallow depth of field provided by near-field scanning optical microscopy. Our results show a distinct buildup of optical intensity between the mirror stacks. Simulations performed using the transfer matrix method match well with the experimental data. ©1998 American Institute of Physics.

 

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