High‐performance thin‐film transistors from optimized polycrystalline silicon films
作者:
D. B. Meakin,
P. A. Coxon,
P. Migliorato,
J. Stoemenos,
N. A. Economou,
期刊:
Applied Physics Letters
(AIP Available online 1987)
卷期:
Volume 50,
issue 26
页码: 1894-1896
ISSN:0003-6951
年代: 1987
DOI:10.1063/1.97678
出版商: AIP
数据来源: AIP
摘要:
The performance of thin‐film transistors fabricated in unrecrystallized (small‐grain) polcrystalline silicon is shown to be greatly improved by depositing the films at much lower pressures than normally used in the low‐pressure chemical vapor deposition process. Electronic measurements on completed devices are presented and related to the film structure by transmission electron microscopy examination.
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