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Atomic point‐contact imaging

 

作者: D. P. E. Smith,   G. Binnig,   C. F. Quate,  

 

期刊: Applied Physics Letters  (AIP Available online 1986)
卷期: Volume 49, issue 18  

页码: 1166-1168

 

ISSN:0003-6951

 

年代: 1986

 

DOI:10.1063/1.97403

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In tunneling microscopy a potential barrier separates a pointed tip from the sample to be investigated. In this letter we show that atomic resolution can be achieved in special cases where the gap spacing has been reduced to the point where the potential barrier may have completely collapsed. In this example the tip may be said to be touching the sample. The forces between the tip and sample are then strongly repulsive and the possibility exists for studying tribology on an atomic scale.

 

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