Atomic point‐contact imaging
作者:
D. P. E. Smith,
G. Binnig,
C. F. Quate,
期刊:
Applied Physics Letters
(AIP Available online 1986)
卷期:
Volume 49,
issue 18
页码: 1166-1168
ISSN:0003-6951
年代: 1986
DOI:10.1063/1.97403
出版商: AIP
数据来源: AIP
摘要:
In tunneling microscopy a potential barrier separates a pointed tip from the sample to be investigated. In this letter we show that atomic resolution can be achieved in special cases where the gap spacing has been reduced to the point where the potential barrier may have completely collapsed. In this example the tip may be said to be touching the sample. The forces between the tip and sample are then strongly repulsive and the possibility exists for studying tribology on an atomic scale.
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