The layered synthetic microstructure (LSM) technology has made two‐dimensional soft x‐ray imaging of a tokamak plasma in a single impurity spectral line emission feasible. The curved LSM is used both as an optical filter, with a bandpass in the range of interest on the order of 1.5 A˚, and as a focusing optic. A detailed design of a narrow bandpass curved LSM‐based pinhole camera, which will image the the region from the scrape‐off layer 26 cm into the plasma in the DIII‐D tokamak plasma in C viLyman &agr; emission at 34 A˚, will be presented.