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Oscillating contrast in room-temperature scanning tunneling microscope images of localized charges in III–V semiconductor cleavage surfaces

 

作者: C. Domke,   M. Heinrich,   Ph. Ebert,   K. Urban,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1998)
卷期: Volume 16, issue 5  

页码: 2825-2832

 

ISSN:1071-1023

 

年代: 1998

 

DOI:10.1116/1.590278

 

出版商: American Vacuum Society

 

关键词: GaAs:Si

 

数据来源: AIP

 

摘要:

Positively and negatively charged defects and dopant atoms inn-doped GaAs(110) surfaces give rise, at room temperature, in occupied-state scanning tunneling microscope images to a bright elevation, which is surrounded by a dark depression ring. This oscillating contrast is not observed in empty-state images. A similar effect is found onn-doped GaP(110) surfaces. A simulation of the contrast induced by localized charges on (110) surfaces of III–V semiconductors suggests that the oscillation in room-temperature scanning tunneling microscope images can be explained as the image of the local potential change (screened Coulomb potential) induced by the presence of the charge.

 

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