Atomic-scale and nanoscale self-patterning in ferroelectric thin films
作者:
J. F. Scott,
M. Dawber,
期刊:
AIP Conference Proceedings
(AIP Available online 1900)
卷期:
Volume 535,
issue 1
页码: 129-135
ISSN:0094-243X
年代: 1900
DOI:10.1063/1.1324448
出版商: AIP
数据来源: AIP
摘要:
This paper describes the role of oxygen vacancy self-patterning on fatigue in ferroelectric thin-film memories. It also comments briefly on the related problem of nano-electrode self patterning on the surface of ferroelectric thin films. And it suggests a pedagogically simple explanation of the factor of a million in reduction of the effective Richardson coefficientA*for ferroelectric thin films. ©2000 American Institute of Physics.
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