Critical current densities (Jc) in YBa2Cu3O7−xfilms made at deposition rates from 0.1 to 14.5 nm/s (∼50 &mgr;m/h) were measured using a direct transport method. As the deposition rate was increased by two orders of magnitude, the films exhibited no marked degradation in current carrying capability withJcof ∼4×106A/cm2at 77 K and zero field.Jcfor all the films showed similar behavior under a magnetic field up to 8 T, although extra structural defects were found in the films deposited at the higher rates. The results from this experiment indicate the feasibility for coating wires, tapes, and other macroscopic shapes with highTcsuperconductors using proper vapor deposition techniques.