Single Electrometer Method of Measuring Transport Properties of High-Resistivity Semiconductors
作者:
T. M. Baleshta,
J. D. Keys,
期刊:
American Journal of Physics
(AIP Available online 1968)
卷期:
Volume 36,
issue 1
页码: 23-26
ISSN:0002-9505
年代: 1968
DOI:10.1119/1.1974402
出版商: American Association of Physics Teachers
数据来源: AIP
摘要:
A method is described whereby the electrical conductivity and Hall coefficient of high-resistivity semiconductors can be measured using a single electrometer for current and voltage measurements. Measurements are made following the L. J. van der Pauw technique with the electrometer switched to perform the necessary functions while maintaining the low side at ground potential. The variation of conductivity and Hall coefficient with temperature can be determined by a point by point method or the data can be recorded on anX-Yrecorder. Conductivities as low as10−10Ω−1·cm−1have been measured.
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