Electrical properties of as‐grown Hg1−xCdxTe epitaxial layers
作者:
S. H. Shin,
M. Chu,
A. H. B. Vanderwyck,
M. Lanir,
C. C. Wang,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 7
页码: 3772-3775
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.328166
出版商: AIP
数据来源: AIP
摘要:
The Hall coefficient and resistivity of Hg1−xCdxTe epitaxial layers with 0.195<x<0.351, have been measured between 4 and 300 K. At 77 K the results forx=0.30 show that as‐grown epitaxial layers areptype, with a carrier concentration and mobility on the order of 1.2×1016cm−3and 400 cm2/V s, respectively. The acceptor ionization energy determined by the Hall measurements is found to change with the energy gap of Hg1−xCdxTe . The electrical parameters and compositional uniformity (&Dgr;x=±0.001) of the epilayer forx=0.30 indicate that the material is comparable to the best reported bulk Hg1−xCdxTe single crystal.
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