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Potential barrier model incorporating localized states explaining tunnel anomalies

 

作者: J. Halbritter,  

 

期刊: Journal of Applied Physics  (AIP Available online 1985)
卷期: Volume 58, issue 3  

页码: 1320-1325

 

ISSN:0021-8979

 

年代: 1985

 

DOI:10.1063/1.336100

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Most tunnel barriers contain localized electronic statesnl(&Dgr;x, &egr;) in large amounts decreasing with distance &Dgr;xfrom the metal. The localized states hybridize with conduction electrons forming interface states with a decay width &Dgr;l∝exp(−2&Dgr;x&kgr;) and a correlation energy &Dgr;U* ∝ 1/&egr;r&Dgr;x. For &Dgr;U*>&Dgr;lthese states are localized, which yields a strong coupling to surface plasmons, phonons, and spins. These states cause diffuse surface scattering and enhance exponentially [∝ &Dgr;−1l ∝exp(+2&Dgr;x&kgr;)] the tunnel matrix element by resonant tunneling jRas compared to tunnelingj&fgr;¯through the whole potential barrier &fgr;¯. Consequently at voltages ‖eU‖ <&fgr;¯,jR(U,T) is identified by its strongerUandTdependencies and can even dominate overj&fgr;¯. The enhanced interaction of the localized electrons with surface plasmons, phonons, and spins yield strongU,T, and time dependencies in the tunnel current which produce giant zero‐bias anomaly and spin‐flip zero‐bias anomaly; capacitance changes; inelastic processes, noise, and barrier reduction with increasing temperature; and pair weakening, leakage current, and reduction of the Josephson current.

 

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