Structure refinement of quasicrystalline Al62Cu20Co15Si3by electron channelling
作者:
W. Sigle,
期刊:
Philosophical Magazine Letters
(Taylor Available online 1993)
卷期:
Volume 68,
issue 1
页码: 39-43
ISSN:0950-0839
年代: 1993
DOI:10.1080/09500839308242274
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The enhanced X-ray production by channelled electrons is used to investigate the planarity of the periodically stacked (00001) planes in decagonal Al62Cu20Co15Si3. The results strongly suggest that the planes are not perfectly flat as assumed in previous models but that a fraction of the Al atoms and probably all Si atoms are displaced out of the planes.
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