A Point Focusing X‐Ray Monochromator for the Study of Low Angle Diffraction
作者:
Leon Shenfil,
Warren E. Danielson,
Jesse W. M. DuMond,
期刊:
Journal of Applied Physics
(AIP Available online 1952)
卷期:
Volume 23,
issue 8
页码: 854-859
ISSN:0021-8979
年代: 1952
DOI:10.1063/1.1702319
出版商: AIP
数据来源: AIP
摘要:
A point focusing x‐ray monochromator was designed and constructed for low angle scattering studies. The anastigmatic point focus is achieved by means of two cylindrically bent quartz crystals whose focal circles are mutually perpendicular. The beam, emanating from the copper target of an x‐ray tube, is reflected in succession, first from the crystal defining the horizontal focal circle, and second from the crystal defining the vertical focal circle following which it comes to a monochromatic point focus of wavelength 1.537A (CuK&agr;1). The sample to be studied is placed between the second crystal and the point focus, and the scattered beam is detected by means of a photographic film placed at the point focus, at right angles to the undeviated beam, the latter being suppressed by means of an absorber, or allowed to pass through a hole in the film.Mathematical analysis, in which a ray was traced through the two‐crystal system, revealed correctly the shape and size of the point focus, and the possibility of reducing the latter in size by stopping down the beam emerging from the target.
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