Reliability Test Plans for One-Shot Devices Based on Repeated Samples
作者:
BainLee J.,
EngelhardtMax,
期刊:
Journal of Quality Technology
(Taylor Available online 1991)
卷期:
Volume 23,
issue 4
页码: 304-311
ISSN:0022-4065
年代: 1991
DOI:10.1080/00224065.1991.11979346
出版商: Taylor&Francis
关键词: Confidence Limits;Reliability;Sample Size;Test Plans;Weibull Degradation Model
数据来源: Taylor
摘要:
A“one-shot”device has the property that a successful test results in its destruction. An obvious example is the testing of an explosive device selected from a stockpile of military weapons. The type of data obtained differs from that of the standard life-testing situation. Such data is dichotomous (go or no go) rather than data obtained by measuring a continuous variable such as failure time or stress level. The emphasis in this paper is on test plans for periodic testing of highly reliable one-shot devices. Based on model assumptions, the sequence of minimal sample sizes, achieving specified reliability criteria, are derived.
点击下载:
PDF (607KB)
返 回