Observation of surface dissociation of low-energy polyatomic ions relevant to plasma processing
作者:
H. Sugai,
Y. Mitsuoka,
H. Toyoda,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1998)
卷期:
Volume 16,
issue 1
页码: 290-293
ISSN:0734-2101
年代: 1998
DOI:10.1116/1.580984
出版商: American Vacuum Society
数据来源: AIP
摘要:
To gain insight into surface processes in plasma processing, basic ion beam experiments are performed on two representative polyatomic-ion species: hydrocarbon ions CHx+for deposition processes and fluorocarbon ions CFx+for etching processes(x=1,2,…). A single ion species is extracted from an inductive plasma via a mass filter and directed onto aluminum surfaces at energies100 eV) incidence of both CHx+and CFx+species gives rise to dissociation into smaller fragment ions, probably via electronic excitation.
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