We present a self‐actuating and self‐sensing probe, with an electrically connected, monolithic tip for dynamic AFM. It is based on a quartz tuning fork and a microfabricated cantilever. The tuning fork — cantilever assembly opens a new avenue for electrically contacting the tip in a reproducible way. Such a probe can be used for scanned gate microscopy and for atomic force probers. Since the probe is self‐sensing, the probe can be used in environments where optical readout is not possible. Our probes allows for batch fabrication and assembly. © 2003 American Institute of Physics