Electrodeless Determination of Semiconductor Conductivity from TE01°‐Mode Reflectivity
作者:
K. S. Champlin,
J. D. Holm,
G. H. Glover,
期刊:
Journal of Applied Physics
(AIP Available online 1967)
卷期:
Volume 38,
issue 1
页码: 96-98
ISSN:0021-8979
年代: 1967
DOI:10.1063/1.1709017
出版商: AIP
数据来源: AIP
摘要:
Microwave conductivity of semiconductors determined from transmission or reflection of the dominant mode of rectangular waveguide may contain a significant error caused by the impedance of the contact between the sample and the broad waveguide wall. This error increases with increasing bulk conductivity. The present paper describes a technique which eliminates this source of error by utilizing the TE01° mode of circular waveguide in a ``reflection coefficient bridge.'' Measurements of intrinsic germanium at 48 GHz show no contact influence over the conductivity range between 2 and 2×103mho/m. In contrast, the conductivity measured with a conventional rectangular waveguide transmission bridge saturates at about 50 mho/m.
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