Electrical activation processes of p+ions channeled along the [110] axis of silicon: Effect of annealing on carriers profiles shape
作者:
F. Cembali,
R. Galloni,
F. Zignani,
期刊:
Radiation Effects
(Taylor Available online 1975)
卷期:
Volume 26,
issue 3
页码: 161-171
ISSN:0033-7579
年代: 1975
DOI:10.1080/00337577508234746
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
Phosphorus ions at energies of 100, 200 and 300 keV and doses : etween 5 × 1014and 5 × 1015at/cm2have been implanted into silicon crystals along the [110] axis.
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