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Native tellurium dioxide layer on cadmium telluride: A high‐resolution electron microscopy study

 

作者: F. A. Ponce,   R. Sinclair,   R. H. Bube,  

 

期刊: Applied Physics Letters  (AIP Available online 1981)
卷期: Volume 39, issue 12  

页码: 951-953

 

ISSN:0003-6951

 

年代: 1981

 

DOI:10.1063/1.92623

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An epitaxial tellurium dioxide layer has been observed on an oxidized {110} surface of a cadmium telluride single crystal. The structure of the oxide layer has been determined using high‐resolution transmission electron microscopy (TEM) and identified as that of the mineral tellurite (TeO2). The interface is abrupt and coherent throughout the observed region. Crystallographic relationships at the interface suggest a model for oxidation.

 

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