Native tellurium dioxide layer on cadmium telluride: A high‐resolution electron microscopy study
作者:
F. A. Ponce,
R. Sinclair,
R. H. Bube,
期刊:
Applied Physics Letters
(AIP Available online 1981)
卷期:
Volume 39,
issue 12
页码: 951-953
ISSN:0003-6951
年代: 1981
DOI:10.1063/1.92623
出版商: AIP
数据来源: AIP
摘要:
An epitaxial tellurium dioxide layer has been observed on an oxidized {110} surface of a cadmium telluride single crystal. The structure of the oxide layer has been determined using high‐resolution transmission electron microscopy (TEM) and identified as that of the mineral tellurite (TeO2). The interface is abrupt and coherent throughout the observed region. Crystallographic relationships at the interface suggest a model for oxidation.
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