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Vacuum X‐Ray Diffractometer for High Temperature Studies of Metals Sensitive to Contamination by Oxygen and Nitrogen

 

作者: R. H. Willens,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1962)
卷期: Volume 33, issue 10  

页码: 1069-1076

 

ISSN:0034-6748

 

年代: 1962

 

DOI:10.1063/1.1717685

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An x‐ray diffractometer operating in vacuum has been designed and constructed to study metals sensitive to oxygen and nitrogen contamination at elevated temperature. The instrument operates in a vacuum of 2×10−6mm Hg in which the partial pressure of oxygen and nitrogen is several orders of magnitude lower than the total pressure. The specimen is heated by radiation from a resistance‐type furnace to 1200°C. With this instrument it is possible to obtain lattice parameters which are accurate to one part in forty thousand. The thermal expansion of titanium has been investigated up to 650°C. Between room temperature and 400°C the expansion coefficients in directions perpendicular and parallel to thecaxis are 9.41×10−6and 11.18×10−6/°C, respectively. For a random polycrystalline sample, the mean expansion coefficient is 10.0×10−6/°C.

 

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