Comment on “Including getter effect in a numerical contrast calculation for micrographs: A numerical contrast calculation for electron beam induced current at gettered dislocations” [Appl. Phys. Lett.69, 4090 (1996)]

 

作者: C. Donolato,  

 

期刊: Applied Physics Letters  （AIP Available online 1997）
卷期: Volume 71, issue 15  

页码: 2216-2216

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119385

 

出版商: AIP

 

数据来源: AIP

 

 

点击下载:  PDF (41KB)

返 回