MC model of Auger spectra from highly charged ion beam surface interaction
作者:
J. Bleck-Neuhaus,
R.A. N. Page,
A. Saal,
期刊:
Radiation Effects and Defects in Solids
(Taylor Available online 1994)
卷期:
Volume 130-131,
issue 1
页码: 157-165
ISSN:1042-0150
年代: 1994
DOI:10.1080/10420159408219778
出版商: Taylor & Francis Group
关键词: Highly charged ion;surface;auger electron spectroscopy;Monte Carlo simulation;electron solid interaction;line shape
数据来源: Taylor
摘要:
A Monte Carlo code is described which simulates angle resolved Auger electron energy spectra from highly charged ion surface interaction. The combined effect of the Doppler spread of laboratory emission energy and electron scattering by the solid, together with the broad inherent line width, is found to have considerable influence on the spectral lines. As a new feature, low or high energy shoulders can appear. By comparison between simulated and measured spectra information on the kinematic and electronic state of the projectile ions in the moment of electron emission can be extracted. The standard method of spectrum analysis, which is based on the assumption of direct escape of the electrons, is evaluated with respect to the simulated spectra.
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