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MC model of Auger spectra from highly charged ion beam surface interaction

 

作者: J. Bleck-Neuhaus,   R.A. N. Page,   A. Saal,  

 

期刊: Radiation Effects and Defects in Solids  (Taylor Available online 1994)
卷期: Volume 130-131, issue 1  

页码: 157-165

 

ISSN:1042-0150

 

年代: 1994

 

DOI:10.1080/10420159408219778

 

出版商: Taylor & Francis Group

 

关键词: Highly charged ion;surface;auger electron spectroscopy;Monte Carlo simulation;electron solid interaction;line shape

 

数据来源: Taylor

 

摘要:

A Monte Carlo code is described which simulates angle resolved Auger electron energy spectra from highly charged ion surface interaction. The combined effect of the Doppler spread of laboratory emission energy and electron scattering by the solid, together with the broad inherent line width, is found to have considerable influence on the spectral lines. As a new feature, low or high energy shoulders can appear. By comparison between simulated and measured spectra information on the kinematic and electronic state of the projectile ions in the moment of electron emission can be extracted. The standard method of spectrum analysis, which is based on the assumption of direct escape of the electrons, is evaluated with respect to the simulated spectra.

 

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