Numerical calculations are used to determine the magnitude and directions of surface atomic displacements produced by imaging a tungsten specimen in a field ion microscope. These displacements are induced by surface forces resulting from the high electric field required for imaging in the instrument. The computations reveal that the maximum displacements occur in the brightly imaging regions of a tungsten emitter and can be as large as 0.1 nm. A color photographic technique is used to directly reveal the displacements in an actual experiment. The results of theexperiments corroborate those of the calculations.