An integrated PC‐based characterization system for optical waveguides
作者:
B. K. Singh,
U. N. Hivarkar,
D. C. Gharpure,
A. D. Shaligram,
期刊:
Review of Scientific Instruments
(AIP Available online 1995)
卷期:
Volume 66,
issue 3
页码: 2690-2694
ISSN:0034-6748
年代: 1995
DOI:10.1063/1.1145611
出版商: AIP
数据来源: AIP
摘要:
This paper reports an automatic instrument developed for characterization of optical waveguides. A specially designed waveguide excitation unit offers a flexible platform for measurement of optical waveguide characteristics like number of propagating modes, mode field intensity distribution, the refractive index profiles, waveguide geometry, attenuation, and dispersion. Further, the availability of attachments like filters, polarizers, chopper, intensity profiler, and CCD camera make the instrument flexible enough for a variety of other experiments also. The instrument is PC controlled and assisted by user friendly menu‐driven software. A large number of waveguides have been analyzed using the setup. These results are also presented in the paper. ©1995 American Institute of Physics.
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