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Velocity Filtering for Secondary Ion Quadrupole Mass Spectrometer

 

作者: Z. Sˇroubek,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1973)
卷期: Volume 44, issue 9  

页码: 1403-1404

 

ISSN:0034-6748

 

年代: 1973

 

DOI:10.1063/1.1686398

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A simple method of secondary ion velocity filtering for sputter ion mass spectroscopy is described. The experiments on Ni surfaces show that the method allows sorting of secondary ions according to their adsorption energies and thereby enhances the analytic capabilities of the spectrometer.

 

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