Direct writing of Mo microstructures using high brilliance synchrotron radiation
作者:
P. Va¨terlein,
V. Wu¨stenhagen,
E. Umbach,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 17
页码: 2200-2202
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113946
出版商: AIP
数据来源: AIP
摘要:
Direct deposition of Mo microstructures on Si is demonstrated by photolytic decomposition of condensed Mo(CO)6using the aperture‐limited, high‐intensity radiation from an undulator at the BESSY storage ring. A particular advantage of the instrument, a new photon‐induced scanning Auger microscope, is the possibility of quasisimultaneous exposure (writing) and analysis employing photoemission (PES) or x‐ray induced Auger spectroscopy (XAES) with sufficient energy resolution for detection of chemical differences. The present spatial resolution is 20–30 &mgr;m (for PES and writing) and 3 &mgr;m (for XAES), but this will be improved by adding focusing mirrors. ©1995 American Institute of Physics.
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