首页   按字顺浏览 期刊浏览 卷期浏览 Direct writing of Mo microstructures using high brilliance synchrotron radiation
Direct writing of Mo microstructures using high brilliance synchrotron radiation

 

作者: P. Va¨terlein,   V. Wu¨stenhagen,   E. Umbach,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 17  

页码: 2200-2202

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113946

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Direct deposition of Mo microstructures on Si is demonstrated by photolytic decomposition of condensed Mo(CO)6using the aperture‐limited, high‐intensity radiation from an undulator at the BESSY storage ring. A particular advantage of the instrument, a new photon‐induced scanning Auger microscope, is the possibility of quasisimultaneous exposure (writing) and analysis employing photoemission (PES) or x‐ray induced Auger spectroscopy (XAES) with sufficient energy resolution for detection of chemical differences. The present spatial resolution is 20–30 &mgr;m (for PES and writing) and 3 &mgr;m (for XAES), but this will be improved by adding focusing mirrors. ©1995 American Institute of Physics.

 

点击下载:  PDF (178KB)



返 回