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Micron‐scale thermal characterizations of interfaces parallel or perpendicular to the surface

 

作者: F. Lepoutre,   D. Balageas,   Ph. Forge,   S. Hirschi,   J. L. Joulaud,   D. Rochais,   F. C. Chen,  

 

期刊: Journal of Applied Physics  (AIP Available online 1995)
卷期: Volume 78, issue 4  

页码: 2208-2223

 

ISSN:0021-8979

 

年代: 1995

 

DOI:10.1063/1.360137

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Theoretical and experimental possibilities are presented of a modulated photothermal method, laser‐induced photoreflectance, for inspecting thermal diffusivities and quality of interfaces in composite materials with micron‐scale spatial resolutions. The models are established for semi‐infinite materials containing interfaces parallel or perpendicular to the sample surface. The applications concern thermal diffusivity measurements of anisotropic polycrystals and detection of thermal resistance in damaged materials and at interfaces between reinforcements and matrix in composites. ©1995 American Institute of Physics.

 

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