Micron‐scale thermal characterizations of interfaces parallel or perpendicular to the surface
作者:
F. Lepoutre,
D. Balageas,
Ph. Forge,
S. Hirschi,
J. L. Joulaud,
D. Rochais,
F. C. Chen,
期刊:
Journal of Applied Physics
(AIP Available online 1995)
卷期:
Volume 78,
issue 4
页码: 2208-2223
ISSN:0021-8979
年代: 1995
DOI:10.1063/1.360137
出版商: AIP
数据来源: AIP
摘要:
Theoretical and experimental possibilities are presented of a modulated photothermal method, laser‐induced photoreflectance, for inspecting thermal diffusivities and quality of interfaces in composite materials with micron‐scale spatial resolutions. The models are established for semi‐infinite materials containing interfaces parallel or perpendicular to the sample surface. The applications concern thermal diffusivity measurements of anisotropic polycrystals and detection of thermal resistance in damaged materials and at interfaces between reinforcements and matrix in composites. ©1995 American Institute of Physics.
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