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CARRIER GENERATION AND SWITCHING PHENOMENA INn—GaAs DEVICES

 

作者: H. W. Thim,   S. Knight,  

 

期刊: Applied Physics Letters  (AIP Available online 1967)
卷期: Volume 11, issue 3  

页码: 83-85

 

ISSN:0003-6951

 

年代: 1967

 

DOI:10.1063/1.1755046

 

出版商: AIP

 

数据来源: AIP

 

摘要:

By measuring the steady‐state potential distribution inn—GaAs samples with ohmic contacts, very high electric fields have been found near the anode contacts. In samples withn · L(carrier concentration × sample length) products greater than 1012cm‐2, switching from the Gunn mode to a high current, lower (constant) voltage state takes place along with the appearance of a high field at the anode. In samples withn · Lproducts less than 1012cm‐2the buildup of the high field is accompanied by a sudden increase in current. These high currents are due to carrier generation in a narrow region near the anode.

 

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