CARRIER GENERATION AND SWITCHING PHENOMENA INn—GaAs DEVICES
作者:
H. W. Thim,
S. Knight,
期刊:
Applied Physics Letters
(AIP Available online 1967)
卷期:
Volume 11,
issue 3
页码: 83-85
ISSN:0003-6951
年代: 1967
DOI:10.1063/1.1755046
出版商: AIP
数据来源: AIP
摘要:
By measuring the steady‐state potential distribution inn—GaAs samples with ohmic contacts, very high electric fields have been found near the anode contacts. In samples withn · L(carrier concentration × sample length) products greater than 1012cm‐2, switching from the Gunn mode to a high current, lower (constant) voltage state takes place along with the appearance of a high field at the anode. In samples withn · Lproducts less than 1012cm‐2the buildup of the high field is accompanied by a sudden increase in current. These high currents are due to carrier generation in a narrow region near the anode.
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