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Structure of Spherulites as Revealed by Selected‐Area Electron Diffraction and Electron Microscopy

 

作者: Robert G. Scott,  

 

期刊: Journal of Applied Physics  (AIP Available online 1957)
卷期: Volume 28, issue 10  

页码: 1089-1090

 

ISSN:0021-8979

 

年代: 1957

 

DOI:10.1063/1.1722583

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Two‐dimensional spherulites in thin films of the 6–6 nylon have been studied by selected‐area electron diffraction, bright‐field and dark‐field electron microscopy. The electron diffraction patterns were found to be comparable to studies using limited area x‐ray diffraction. In this sample they showed that the molecules were arranged in sheets with the hydrogen bonds in the plane of the film. Large field areas were used and as a result no preferred direction of orientation was seen. However, in dark‐field electron microscopy, by using only those Bragg electrons scattered into limited portions of the principle rings, the radical growth and branching of discrete crystalline regions was seen. Bright field electron microscopy showed the surface morphology of these structures.

 

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