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Non-volatile ferroelectric superconducting field effect transistor

 

作者: Alex Ignatiev,   Nai-Juan Wu,   He Lin,   Tian-Qiao Huang,   Scott Endicter,   Xian-Yi Li,   Dong Liu,  

 

期刊: Integrated Ferroelectrics  (Taylor Available online 1995)
卷期: Volume 10, issue 1-4  

页码: 327-334

 

ISSN:1058-4587

 

年代: 1995

 

DOI:10.1080/10584589508012290

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

A ferroelectric-superconducting three-terminal device consisting of a YBa2Cu3O7-x(YBCO) base layer and a PbZrTiO3(PZT) gate has been fabricated which acts as a ferroelectric-superconducting field effect transistor (FSuFET). The PZT /YBCO layers were deposited sequentially on an MgO (100) substrate by excimer laser deposition. The thickness of the YBCO layer was nominally 100nm and that of the PZT layer was 500nm. Both conventional DC measurements and a modified admittance spectroscopy method were used to characterize the device. The YBCO channel resistance has been shown to be modulated by over 25% dependent on the polarization of the PZT gate, the highest modulation shown to date. The polarization state and thus the channel state were retained for greater than 106seconds. This was the first demonstration of non-volatility in such a superconducting logic device. The transient behavior of the ferroelectric-superconducting device has also been studied and shows four-state characteristics. The four states can be controlled by changing the PZT polarization state or switching of the YBCO channel from the superconducting state to the normal state.

 

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