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Direct experimental evidence for trap‐state mediated excitation of Er3+in silicon

 

作者: Jung H. Shin,   G. N. van den Hoven,   A. Polman,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 3  

页码: 377-379

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.114634

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The time evolution of the 1.54 &mgr;m Er3+photoluminescence intensity of Er‐doped silicon following a 30 &mgr;s excitation pulse is investigated. It is found that at 9 K, the 1.54 &mgr;m luminescence from Er3+continues to increase up to 50 &mgr;s after the pulse is terminated, when excess photocarriers no longer exist. This provides the first direct experimental evidence that a state in the forbidden gap of silicon acts as the gateway to the excitation of Er3+. Further analysis indicates recombination of bound excitons to be the most likely excitation mechanism. ©1995 American Institute of Physics.

 

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