Direct experimental evidence for trap‐state mediated excitation of Er3+in silicon
作者:
Jung H. Shin,
G. N. van den Hoven,
A. Polman,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 3
页码: 377-379
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114634
出版商: AIP
数据来源: AIP
摘要:
The time evolution of the 1.54 &mgr;m Er3+photoluminescence intensity of Er‐doped silicon following a 30 &mgr;s excitation pulse is investigated. It is found that at 9 K, the 1.54 &mgr;m luminescence from Er3+continues to increase up to 50 &mgr;s after the pulse is terminated, when excess photocarriers no longer exist. This provides the first direct experimental evidence that a state in the forbidden gap of silicon acts as the gateway to the excitation of Er3+. Further analysis indicates recombination of bound excitons to be the most likely excitation mechanism. ©1995 American Institute of Physics.
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