Ferromagnetic domains as well as imperfections in the interior of Fe&sngbnd;Si single crystals are observed by the x‐ray topographic technique employing the anomalous transmission of x‐rays (Borrmann effect). X‐ray topographic images of domains are compared with the Bitter patterns obtained in the same region of a single crystal of Fe&sngbnd;3% Si. It is shown that when a suitable reflecting plane is used and the domain arrangement remains unchanged during the experiment, an exact correlation exists between the Bitter pattern and the x‐ray topograph.