A Fourier transform microscope for x‐ray imaging
作者:
K. S. Wood,
U. Feldman,
P. A. Becker,
R. J. Nemiroff,
D. R. Kania,
期刊:
Review of Scientific Instruments
(AIP Available online 1992)
卷期:
Volume 63,
issue 10
页码: 5089-5093
ISSN:0034-6748
年代: 1992
DOI:10.1063/1.1143501
出版商: AIP
数据来源: AIP
摘要:
This is a progress report on development of a new x‐ray imaging system, called a Fourier transform microscope, intended for use with x‐ray emitting targets in laser fusion experiments. It is being built by Naval Research Laboratory and Lawrence Livermore National Laboratory. The system works at energies from 3 to 7 keV. We describe the development of the design, which utilizes fine etched grids to extract Fourier amplitudes for the source brightness distribution at selected spatial frequencies. The finest grids in the prototype system will have rib dimensions of 2 &mgr;m. The prototype system is expected to achieve position resolution of 4 &mgr;m in 3–7 keV. Simulations of the expected imaging performance are presented.
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