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Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy

 

作者: Vu Thien Binh,   S. T. Purcell,   V. Semet,   F. Feschet,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 8  

页码: 975-977

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.120614

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The magnetic leakage fields from the poles of magnetic nanoparticles down to105–106spins, isolated or situated at the edges of clusters, are observed with Fresnel projection microscopy by the presence of interference fringes generated by the magnetic phase shifts in the imaging electron beam. The particle shapes and localization of fringes are imaged simultaneously with nanometer spatial resolution at∼200 V.©1998 American Institute of Physics.

 

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