Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy
作者:
Vu Thien Binh,
S. T. Purcell,
V. Semet,
F. Feschet,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 8
页码: 975-977
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.120614
出版商: AIP
数据来源: AIP
摘要:
The magnetic leakage fields from the poles of magnetic nanoparticles down to105–106spins, isolated or situated at the edges of clusters, are observed with Fresnel projection microscopy by the presence of interference fringes generated by the magnetic phase shifts in the imaging electron beam. The particle shapes and localization of fringes are imaged simultaneously with nanometer spatial resolution at∼200 V.©1998 American Institute of Physics.
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