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Deep ultraviolet enhanced wet chemical etching of gallium nitride

 

作者: L.-H. Peng,   C.-W. Chuang,   J.-K. Ho,   C.-N. Huang,   C.-Y. Chen,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 8  

页码: 939-941

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.120879

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report a study of the ultraviolet (UV) irradiation effects on the wet chemical etching of unintentionally dopedn-type gallium nitride (GaN) layers grown on sapphire substrates. When illuminated with a 253.7 nm mercury line source, etching of GaN is found to take place in aqueous phosphorus acid(H3PO4)and potassium hydroxide (KOH) solutions ofpHvalues ranging from−1to 2 and 11 to 15, respectively. Formation of gallium oxide is observed on GaN when illuminated in diluteH3PO4and KOH solutions. These results are attributed to a two-step reaction process upon which the UV irradiation is shown to enhance the oxidative dissolution of GaN. ©1998 American Institute of Physics. 

 

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