Deep ultraviolet enhanced wet chemical etching of gallium nitride
作者:
L.-H. Peng,
C.-W. Chuang,
J.-K. Ho,
C.-N. Huang,
C.-Y. Chen,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 8
页码: 939-941
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.120879
出版商: AIP
数据来源: AIP
摘要:
We report a study of the ultraviolet (UV) irradiation effects on the wet chemical etching of unintentionally dopedn-type gallium nitride (GaN) layers grown on sapphire substrates. When illuminated with a 253.7 nm mercury line source, etching of GaN is found to take place in aqueous phosphorus acid(H3PO4)and potassium hydroxide (KOH) solutions ofpHvalues ranging from−1to 2 and 11 to 15, respectively. Formation of gallium oxide is observed on GaN when illuminated in diluteH3PO4and KOH solutions. These results are attributed to a two-step reaction process upon which the UV irradiation is shown to enhance the oxidative dissolution of GaN. ©1998 American Institute of Physics.
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