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Reply to ‘‘Comments on the steady state photocarrier grating technique to measure diffusion lengths’’

 

作者: K. Weiser,  

 

期刊: Journal of Applied Physics  （AIP Available online 1992）
卷期: Volume 71, issue 11  

页码: 5728-5728

 

ISSN:0021-8979

 

年代: 1992

 

DOI:10.1063/1.350513

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It is pointed out that the experimental pitfalls in carrying out steady state photocarrier grating measurements, mentioned by Prabhuetal. are apparently very rare since the diffusion lengths ina‐Si:H determined by this method in many laboratories yield very similar results.

 

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