Imperfections Associated with Dielectric Breakdown in LiF
作者:
J. W. Davisson,
J. Pasternak,
W. H. Vaughan,
期刊:
Journal of Applied Physics
(AIP Available online 1964)
卷期:
Volume 35,
issue 10
页码: 3017-3023
ISSN:0021-8979
年代: 1964
DOI:10.1063/1.1713148
出版商: AIP
数据来源: AIP
摘要:
Linear imperfections, oriented in or near the 〈110〉 directions, accompany 〈xxy〉 and 〈110〉 electrical breakdown paths formed in LiF single crystals at room temperature. They may be screw dislocation pairs produced by the action of the electrical field on dislocation loops that were generated in the vicinity of the breakdown path.
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