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Imperfections Associated with Dielectric Breakdown in LiF

 

作者: J. W. Davisson,   J. Pasternak,   W. H. Vaughan,  

 

期刊: Journal of Applied Physics  (AIP Available online 1964)
卷期: Volume 35, issue 10  

页码: 3017-3023

 

ISSN:0021-8979

 

年代: 1964

 

DOI:10.1063/1.1713148

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Linear imperfections, oriented in or near the ⟨110⟩ directions, accompany ⟨xxy⟩ and ⟨110⟩ electrical breakdown paths formed in LiF single crystals at room temperature. They may be screw dislocation pairs produced by the action of the electrical field on dislocation loops that were generated in the vicinity of the breakdown path.

 

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