Particle charging in low‐pressure plasmas
作者:
Themis Matsoukas,
Marc Russell,
期刊:
Journal of Applied Physics
(AIP Available online 1995)
卷期:
Volume 77,
issue 9
页码: 4285-4292
ISSN:0021-8979
年代: 1995
DOI:10.1063/1.359451
出版商: AIP
数据来源: AIP
摘要:
Particles embedded in a plasma acquire a net charge as a result of collisions with electrons and ions. Due to the stochastic nature of encounters between particle and charged species, the instantaneous charge fluctuates. The static properties of the charge fluctuations are quantified for particles surrounded by an undisturbed plasma in orbital motion limit. For particles that satisfy the conditione2/4&pgr;&egr;0RkTe≪1 the charge distribution is a Gaussian function whose average and variance is related to the ion and electron currents toward the particle. For a Maxwellian plasma, in particular, analytical solutions are developed for the average charge and the variance as a function of the parameters of the plasmane/ni,Te/Ti, andMe/Mi. Finally, the methodology is extended to non‐Maxwellian plasmas using the Druyvesteyn as an example. ©1995 American Institute of Physics.
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